Vacuum arc research expands interpretation of test data from vacuum interrupters

M. B. Schulman, R. Kirkland Smith
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引用次数: 6

Abstract

Using high-speed movies of vacuum arcs between spiral contacts in conjunction with floating arc shields, the arc voltage, current and contact travel have been correlated with arc behaviors. These arc behaviors can be described by arc appearance diagrams in gap-current space. These allow the waveforms from high-power tests on spiral-contact vacuum interrupters to be evaluated for information on the internal arcing behavior and arc-induced damage. We have found that arc voltage traces can be examined during interruption testing to help in judging the probability that a vacuum interrupter will continue to pass additional interruption trials. The arc voltage also reveals signs of damage to the contacts, such as melting caused by a prolonged interval of a stationary high-current arc column. This information enhances the statistics we use in single-phase pass/fail testing of interrupters to assess manufacturing quality and the probability that new designs will pass three-phase certification. Correlation of arc voltage traces with the arc appearance and arc motion is also discussed for butt-type contacts, axial magnetic field contacts, and radial magnetic field slotted-cup contacts.
真空弧的研究扩展了对真空灭弧器试验数据的解释
利用螺旋触点之间的高速真空电弧与浮弧屏蔽体结合,研究了电弧电压、电流和触点行程与电弧行为的关系。这些电弧行为可以用间隙电流空间中的电弧外观图来描述。这样就可以对螺旋接触真空灭弧器的高功率测试波形进行评估,以获取有关内部电弧行为和电弧引起的损伤的信息。我们发现,在中断试验期间可以检查电弧电压迹线,以帮助判断真空灭弧器继续通过额外中断试验的可能性。电弧电压也显示出触点损坏的迹象,例如由于长时间间隔固定的大电流电弧柱而引起的熔化。这些信息增强了我们在中断器的单相通过/失败测试中使用的统计数据,以评估制造质量和新设计通过三相认证的可能性。讨论了对接式触点、轴向磁场触点和径向磁场槽杯触点的电弧电压迹线与电弧外观和电弧运动的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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