A 60-GHz SPST switch in 65-nm CMOS technology

Anak Agung Alit Apriyana, Yue Ping Zhang
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Abstract

An enhanced circuit model is developed for a 60-GHz single-pole single-throw (SPST) switch in 65nm CMOS technology in this paper. The enhanced circuit model involves the modeling of the drain-to-source parasitic capacitances that are introduced by the overlapped multi-finger drain-to-source metallization of the transistors and also the modeling the distributive and coupling effect of lines interconnection, testing pads and ground metals. The enhanced circuit model leads to an improved agreement between the simulated and measured performance over the frequency range from 1 to 170 GHz.
采用65纳米CMOS技术的60 ghz SPST开关
本文提出了一种基于65nm CMOS技术的60 ghz单极单掷(SPST)开关增强电路模型。增强电路模型包括由晶体管的多指漏源金属化叠加引起的漏源寄生电容的建模,以及线路互连、测试垫和接地金属的分布和耦合效应的建模。在1到170 GHz的频率范围内,增强电路模型的仿真性能和测量性能之间的一致性得到了改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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