{"title":"Special Session 3 – Panel: SER in Automotive: what is the impact of the AEC Q100-G spec?","authors":"T. Heijmen","doi":"10.1109/IOLTS.2008.68","DOIUrl":null,"url":null,"abstract":"Summary form only given, as follows. A record of the panel discussion was not made available for publication as part of the conference proceedings. In May 2007 the Automotive Electronics Council (AEC) published the AEC-Q100 Revision-G document, which specifies the requirements for the stress qualification of integrated circuits (ICs). Different from previous revisions of this document, Q100-G includes requirements on soft-error rate (SER) qualification. This affects component and IC manufacturers that are involved in the automotive industry. Indirectly, it also affects other companies, research institutes and universities. Because of this, the SER requirements from the AEC Q100-G document have caused many discussions at different levels. In this panel discussion the following questions will be addressed: (1) How important are the SER requirements in AEC Q100-G? (2) How should these requirements be implemented? (3) How are the requirements related to other specs, e.g., to IEC 61508? (4) What are the gaps in knowledge and the needs for further research?","PeriodicalId":261786,"journal":{"name":"2008 14th IEEE International On-Line Testing Symposium","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 14th IEEE International On-Line Testing Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2008.68","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Summary form only given, as follows. A record of the panel discussion was not made available for publication as part of the conference proceedings. In May 2007 the Automotive Electronics Council (AEC) published the AEC-Q100 Revision-G document, which specifies the requirements for the stress qualification of integrated circuits (ICs). Different from previous revisions of this document, Q100-G includes requirements on soft-error rate (SER) qualification. This affects component and IC manufacturers that are involved in the automotive industry. Indirectly, it also affects other companies, research institutes and universities. Because of this, the SER requirements from the AEC Q100-G document have caused many discussions at different levels. In this panel discussion the following questions will be addressed: (1) How important are the SER requirements in AEC Q100-G? (2) How should these requirements be implemented? (3) How are the requirements related to other specs, e.g., to IEC 61508? (4) What are the gaps in knowledge and the needs for further research?