Analysis, modeling and optimization of thick film solenoid-bar type inductors and transformers

L. Zivanov, V. Desnica, O. Aleksic
{"title":"Analysis, modeling and optimization of thick film solenoid-bar type inductors and transformers","authors":"L. Zivanov, V. Desnica, O. Aleksic","doi":"10.1109/ICMEL.2000.838743","DOIUrl":null,"url":null,"abstract":"Solenoid-bar type inductors and transformers with different turns ratio are analyzed. In this paper in equivalent circuit models for inductors and transformers are presented. Parasitic physical phenomena important to prediciton of inductor quality factor Q are included in the model, and special attention is paid to inductance calculations.","PeriodicalId":215956,"journal":{"name":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2000.838743","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

Solenoid-bar type inductors and transformers with different turns ratio are analyzed. In this paper in equivalent circuit models for inductors and transformers are presented. Parasitic physical phenomena important to prediciton of inductor quality factor Q are included in the model, and special attention is paid to inductance calculations.
厚膜电磁棒式电感和变压器的分析、建模和优化
对不同匝比的螺线管式电感和变压器进行了分析。本文给出了电感器和变压器的等效电路模型。该模型考虑了对电感质量因数Q预测很重要的寄生物理现象,并特别注意了电感的计算。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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