ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels
Chen Yixin, Hao Meng, Shao Jingjing, L. Esther, Khoo Bing Sheng, Chooi Meailing, Li Kai, Xing Qiuju, Kon Cambridge, Lee Hwang Sheng, Shen Yiqiang, Song Lu, Xing Zhenxiang, Zhou Yongkai, Feng Yang, Fu Chao, H. Younan, Li Xiaomin
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引用次数: 0
Abstract
White haze or the so called mura effect has been recognized as a common defect in touch panels. Nevertheless, the underlying mechanism has not been fully understood and clearly investigated. In this study, a comprehensive characterization study using the ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS on the high temperature and moisture induced white haze, which follows the pattern of electrodes in touch panels, is first reported. It is suspected that the white haze is a moisture induced reflection alteration phenomenon of the OCA (optically clear adhesive), while the electrodes related pattern is highly dependent on the local variation in hygroscopic swelling.