ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels

Chen Yixin, Hao Meng, Shao Jingjing, L. Esther, Khoo Bing Sheng, Chooi Meailing, Li Kai, Xing Qiuju, Kon Cambridge, Lee Hwang Sheng, Shen Yiqiang, Song Lu, Xing Zhenxiang, Zhou Yongkai, Feng Yang, Fu Chao, H. Younan, Li Xiaomin
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引用次数: 0

Abstract

White haze or the so called mura effect has been recognized as a common defect in touch panels. Nevertheless, the underlying mechanism has not been fully understood and clearly investigated. In this study, a comprehensive characterization study using the ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS on the high temperature and moisture induced white haze, which follows the pattern of electrodes in touch panels, is first reported. It is suspected that the white haze is a moisture induced reflection alteration phenomenon of the OCA (optically clear adhesive), while the electrodes related pattern is highly dependent on the local variation in hygroscopic swelling.
ATR-FTIR,双束FIB-SEM, TEM和TOF-SIMS研究了高温和潮湿诱导的触摸板中电极模式的“白雾”
白雾或所谓的村效应已被认为是触摸屏的常见缺陷。然而,其潜在的机制尚未被完全理解和清楚地调查。在这项研究中,首次报道了使用ATR-FTIR, DUAL BEAM FIB-SEM, TEM和TOF-SIMS对高温和潮湿诱导的白雾的综合表征研究,该白雾遵循触摸板中电极的模式。怀疑白雾是OCA(光学透明胶粘剂)的湿气诱导反射改变现象,而电极相关图案高度依赖于吸湿膨胀的局部变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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