Testing logic cores using a BIST P1500 compliant approach: a case of study

Abstract

In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in system-on-a-chip (SoC) environments. The approach advantages are the ability to protect the core IP, the simple test interface (thanks also to the adoption of the P1500 standard), the possibility to run the test at-speed, the reduced test time, and the good diagnostic capabilities. The paper reports figures of the achieved fault coverage, the required area overhead, and the performance slowdown, and compares the figures with those for alternative approaches, such as those based on full scan and sequential ATPG.