Desien for testability - Session 10

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) Pub Date : 1900-01-01 DOI:10.1109/cicc.2004.1358774

R. Aitken

引用次数: 0

Abstract

Design for Testability OFT) is one of the most cost-effective ways in which to tackle test problems, reduce the cost of test and decrease the time-to-market. DFT techniques for digital circuits are used widely, whereas little is known about DFT for mixed-signal circuits. This session is devoted to describing several methods for mixedsignal DFT of high-speed VOs, in particular, those related to Intel product offerings, together with two papers on A/D converter circuits.

查看原文本刊更多论文

可测试性设计-第10部分

可测试性设计(OFT)是解决测试问题、降低测试成本和缩短上市时间的最经济有效的方法之一。DFT技术在数字电路中的应用非常广泛，但对于混合信号电路的DFT技术却知之甚少。本次会议将介绍几种高速VOs的混合信号DFT方法，特别是与英特尔产品相关的方法，以及两篇关于A/D转换器电路的论文。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)

自引率

0.00%

发文量