Characterization of silicon avalanche photodiode in term of breakdown voltage and leakage current

S. N. Taib, M. Othman, M. N. Husein, Z. Napiah, N. Y. M. Yasin, T. S. M. Arshad
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引用次数: 0

Abstract

The avalanche photodiode is designed by using SILVACO TCAD tool, a simulation tool for fabrication process and also electrical performances. This project proposed a planar Si Avalanche Photodiode with presence of guard ring and non guard ring. It is operated in reverse bias which means by using Silvaco Athena and Atlas, the anode connected to the negative terminal and ground to the cathode in fabrication. The project includes the effect and relationship of avalanche photodiode between substrate concentrations and doping, type of materials, with the breakdown voltage and leakage current were investigated. Then, the structure is applied with guard ring structure .At the end, we choose the best optimized design of avalanche photodiode based on current-voltage characteristics.
硅雪崩光电二极管的击穿电压和漏电流表征
利用SILVACO TCAD仿真工具对雪崩光电二极管的制造过程和电性能进行了仿真设计。本课题提出了一种具有保护环和非保护环的平面硅雪崩光电二极管。它在反向偏压下工作,这意味着通过使用Silvaco Athena和Atlas,阳极连接到负极,并在制造过程中接地到阴极。本课题包括对雪崩光电二极管衬底浓度、掺杂、材料类型、击穿电压和漏电流的影响和关系进行了研究。最后,根据雪崩光电二极管的电流-电压特性选择最佳的优化设计方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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