R. Kapadia, K. Takei, A. C. Ford, Hui Fang, S. Chuang, M. Madsen, S. Krishna, A. Javey
{"title":"Ultra-thin compound semiconductor on insulator (XOI) for MOSFETs and TFETs","authors":"R. Kapadia, K. Takei, A. C. Ford, Hui Fang, S. Chuang, M. Madsen, S. Krishna, A. Javey","doi":"10.1109/DRC.2011.5994400","DOIUrl":null,"url":null,"abstract":"Due to their high electron mobility, III–V semiconductors are promising channel materials for future devices [1]. InAs is one such promising material; however, due to the small bandgap (Eg∼0.36 eV) bulk devices are not feasible. In addition, heteroepitaxial growth of thin layers on Si is challenging due to the inherent lattice mismatch. Here, we present a platform developed for integration of single-crystalline ultra-thin compound semiconductor layers on insulator (XOI)[2], resembling the conventional SOI substrates.","PeriodicalId":107059,"journal":{"name":"69th Device Research Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"69th Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2011.5994400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Due to their high electron mobility, III–V semiconductors are promising channel materials for future devices [1]. InAs is one such promising material; however, due to the small bandgap (Eg∼0.36 eV) bulk devices are not feasible. In addition, heteroepitaxial growth of thin layers on Si is challenging due to the inherent lattice mismatch. Here, we present a platform developed for integration of single-crystalline ultra-thin compound semiconductor layers on insulator (XOI)[2], resembling the conventional SOI substrates.