{"title":"Technology mapping for low power","authors":"C. Yeh, C. Chang, Jinn-Shyan Wang","doi":"10.1109/ASPDAC.1999.759981","DOIUrl":null,"url":null,"abstract":"Power consumption has become a great concern for IC and system designs. As a consequence, power-driven technology mapping has attracted several research attentions. However, the power model they used cannot properly capture the power dissipation when the output of a gate does not switch. In this paper, we propose a pattern oriented power modeling for improved technology mapping. We first perform a profitability study using the complete pattern to pattern transition data organized in tabular form. Then, we propose a probability-based, pattern oriented technology mapping method. Empirical results on benchmark circuits demonstrate the proposed method delivered an average of 13% power reduction compared to the traditional mapping method.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1999.759981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Power consumption has become a great concern for IC and system designs. As a consequence, power-driven technology mapping has attracted several research attentions. However, the power model they used cannot properly capture the power dissipation when the output of a gate does not switch. In this paper, we propose a pattern oriented power modeling for improved technology mapping. We first perform a profitability study using the complete pattern to pattern transition data organized in tabular form. Then, we propose a probability-based, pattern oriented technology mapping method. Empirical results on benchmark circuits demonstrate the proposed method delivered an average of 13% power reduction compared to the traditional mapping method.