Reliability tests on power devices

J. Marcos, J. Pallás, S. Fernandez-Gomez
{"title":"Reliability tests on power devices","authors":"J. Marcos, J. Pallás, S. Fernandez-Gomez","doi":"10.1109/RAMS.2002.981711","DOIUrl":null,"url":null,"abstract":"System dependability has become an important aspect to consider because of the large number of components included in modern systems and the high availability requirements that users demand. In systems such as switch-mode power supplies, power devices like IGBTs play a fundamental role in system functionality and performance, hence the use of reliable components is key. In this paper, the design of dependable systems based on reliable power devices is addressed. Reliability tests have been carried out on a set of IGBTs used in a battery charger to extract accurate reliability prediction models for this type of devices and degradation models, which can help the system designer to generate highly dependable systems. This paper describes the first phase of the authors' research that focus on determining degradation models for IGBTs due to environmental causes. Their tests show the high resistance of the selected devices to environmental stress. None of the devices has failed the tests, and the variation in their electrical characteristics is minimal. This is an important conclusion because our final objective is the design of reliable battery chargers, which requires the use of power devices that can tolerate high stress without degradation of their characteristics. In addition, they were able to detect a flaw in their measurement methodology that helped them to improve their test and analysis flow for the second phase of their research.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2002.981711","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

Abstract

System dependability has become an important aspect to consider because of the large number of components included in modern systems and the high availability requirements that users demand. In systems such as switch-mode power supplies, power devices like IGBTs play a fundamental role in system functionality and performance, hence the use of reliable components is key. In this paper, the design of dependable systems based on reliable power devices is addressed. Reliability tests have been carried out on a set of IGBTs used in a battery charger to extract accurate reliability prediction models for this type of devices and degradation models, which can help the system designer to generate highly dependable systems. This paper describes the first phase of the authors' research that focus on determining degradation models for IGBTs due to environmental causes. Their tests show the high resistance of the selected devices to environmental stress. None of the devices has failed the tests, and the variation in their electrical characteristics is minimal. This is an important conclusion because our final objective is the design of reliable battery chargers, which requires the use of power devices that can tolerate high stress without degradation of their characteristics. In addition, they were able to detect a flaw in their measurement methodology that helped them to improve their test and analysis flow for the second phase of their research.
电力设备可靠性试验
由于现代系统中包含大量组件以及用户要求的高可用性需求,系统可靠性已成为需要考虑的一个重要方面。在开关模式电源等系统中,igbt等电源器件在系统功能和性能中起着基础作用,因此使用可靠的组件是关键。本文研究了基于可靠电源器件的可靠系统设计。对一组用于电池充电器的igbt进行了可靠性试验,提取了该类器件的准确可靠性预测模型和退化模型,可帮助系统设计人员生成高可靠性系统。本文描述了作者研究的第一阶段,重点是确定由于环境原因导致的igbt降解模型。他们的试验表明,所选器件对环境应力具有很高的抵抗力。这些设备都没有通过测试,它们的电气特性变化很小。这是一个重要的结论,因为我们的最终目标是设计可靠的电池充电器,这需要使用能够承受高应力而不降低其特性的电源设备。此外,他们能够发现测量方法中的一个缺陷,这有助于他们改进第二阶段研究的测试和分析流程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信