A Simple and Efficient Procedure for Identifying the Compressing Stage in Two-Stage Amplifiers

Anton N. Atanasov, Waqam H. R. A. Mukhtar Ahmad, M. S. O. Alink, Frank E. van Vliet
{"title":"A Simple and Efficient Procedure for Identifying the Compressing Stage in Two-Stage Amplifiers","authors":"Anton N. Atanasov, Waqam H. R. A. Mukhtar Ahmad, M. S. O. Alink, Frank E. van Vliet","doi":"10.1109/BCICTS50416.2021.9682499","DOIUrl":null,"url":null,"abstract":"We propose a fast and simple method to accurately determine the compressing stage in a two-stage amplifier system based on reverse intermodulation and hot S-parameter measurements. The method uses no specialized hardware and needs little reconfiguration, simplifying the measurements. We demonstrate its validity over a broad range of amplifiers designed in various semiconductor technologies. This method is a very useful tool in understanding or debugging amplifier designs.","PeriodicalId":284660,"journal":{"name":"2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCICTS50416.2021.9682499","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

We propose a fast and simple method to accurately determine the compressing stage in a two-stage amplifier system based on reverse intermodulation and hot S-parameter measurements. The method uses no specialized hardware and needs little reconfiguration, simplifying the measurements. We demonstrate its validity over a broad range of amplifiers designed in various semiconductor technologies. This method is a very useful tool in understanding or debugging amplifier designs.
一种简单有效的两级放大器压缩级识别方法
我们提出了一种基于反向互调和热s参数测量的快速简便的方法来准确确定两级放大器系统中的压缩级。该方法不需要专门的硬件,几乎不需要重新配置,简化了测量。我们在各种半导体技术设计的各种放大器上证明了它的有效性。这种方法是理解或调试放大器设计的一个非常有用的工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信