J. Goo, Kwang-Hoon Oh, Chang-hoon Choi, Zhiping Yu, Thomas H. Lee, Robert W. Dutton
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引用次数: 19
Abstract
The first stage of a receiver is typically an LNA (low noise amplifier) which must provide sufficient gain while introducing as little noise as possible. Recently proposed noise optimization techniques for CMOS RF circuits permit greater flexibility in selection of device geometries as well as matching elements and biasing conditions to minimize the noise figure for a specified gain or power dissipation (Shaeffer and Lee, 1997). Nevertheless, such approaches still have ambiguity because intrinsic noise is assumed to be bias-independent. To utilize the new degrees of freedom in noise figure optimization, more complete intrinsic noise information on MOSFETs across the entire bias range is needed. A recent study has reported extensive experimental noise results of the 0.75 /spl mu/m SOI MOSFET technology (Dambrine et al, 1999) but provided limited guidance for actual LNA design. A physical noise simulator has been developed using two-dimensional device simulation; successful noise simulation results have been reported for MOSFETs with channel lengths down to 0.25 /spl mu/m for the first time (Goo et al, Proc. Symp. VLSI Tech., p. 153, 1999). Based on intrinsic high frequency noise simulation results, this paper presents explicit design guidelines for a CMOS tuned LNA with power constraints.
接收器的第一级通常是LNA(低噪声放大器),它必须提供足够的增益,同时引入尽可能少的噪声。最近提出的CMOS射频电路的噪声优化技术允许更大的灵活性选择器件几何形状,以及匹配元件和偏置条件,以最小化指定增益或功耗的噪声系数(Shaeffer和Lee, 1997)。然而,这种方法仍然具有模糊性,因为固有噪声被认为是与偏差无关的。为了在噪声系数优化中利用新的自由度,需要在整个偏置范围内对mosfet进行更完整的固有噪声信息。最近的一项研究报道了0.75 /spl mu/m SOI MOSFET技术的大量实验噪声结果(Dambrine et al ., 1999),但对实际LNA设计提供的指导有限。利用二维器件仿真技术开发了物理噪声模拟器;首次报道了沟道长度降至0.25 /spl mu/m的mosfet的成功噪声模拟结果(Goo et al ., Proc. Symp.)。VLSI Tech, p. 153, 1999)。基于固有高频噪声仿真结果,给出了具有功率约束的CMOS调谐LNA的明确设计准则。