Obtaining consistent global state dumps to interactively debug systems on chip with multiple clocks

B. Vermeulen, K. Goossens
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引用次数: 6

Abstract

Post-silicon debugging of a system on chip (SOC) is complex due to (1) the intrinsic limits on the internal observability, (2) the absence of a single global clock, and (3) the need for asynchronous intellectual property (IP) blocks to interact with each other. These aspects prevent the instantaneous capture of a complete and consistent state of the SOC, and make the SOC non-deterministic at both the clock cycle level and the behavioral level. To debug an embedded system when the states that are extracted are irreproducible and inconsistent is nearly impossible. In this paper, we therefore introduce a method to capture a consistent, complete state of a multiple-clock SOC for interactive debugging. We reuse the same functionality that is used to ensure correct functional communication between asynchronous IP blocks, namely the handshake signals common in on-chip communication protocols. We merge the required on-chip hardware to support this debug functionality with the traditional debug architecture that reuses the manufacturing scan chains for debug. Our experimental results show that it is possible to ensure a globally consistent state is observed when the system is stopped on a breakpoint event.
获得一致的全局状态转储,以便在具有多个时钟的芯片上交互式调试系统
片上系统(SOC)的硅后调试是复杂的,因为(1)内部可观察性的内在限制,(2)缺乏单个全局时钟,以及(3)需要异步知识产权(IP)块相互交互。这些方面阻止了SOC完整和一致状态的瞬时捕获,并使SOC在时钟周期级别和行为级别上都不确定。当提取的状态不可复制且不一致时,调试嵌入式系统几乎是不可能的。因此,在本文中,我们引入了一种方法来捕获用于交互式调试的多时钟SOC的一致,完整状态。我们重用了用于确保异步IP块之间正确功能通信的相同功能,即片上通信协议中常见的握手信号。我们将所需的片上硬件与传统的调试架构合并以支持此调试功能,该架构重用制造扫描链进行调试。我们的实验结果表明,当系统在断点事件上停止时,可以确保观察到全局一致的状态。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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