{"title":"Specific EMC Requirements for Semiconductor Manufacturing Environment and Review of SEMI E33 and E176 Standards","authors":"V. Kraz","doi":"10.1109/ISEMC.2019.8825245","DOIUrl":null,"url":null,"abstract":"Semiconductor manufacturing environment and processes present unique requirements to EMI environment that may not necessarily fall under “generic” EMC approach. This paper outlines the specific EMI challenges in semiconductor manufacturing and how SEMI (www.semi.org) addresses these issues in its two EMC Standards.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2019.8825245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Semiconductor manufacturing environment and processes present unique requirements to EMI environment that may not necessarily fall under “generic” EMC approach. This paper outlines the specific EMI challenges in semiconductor manufacturing and how SEMI (www.semi.org) addresses these issues in its two EMC Standards.