Experimental studies of the temperature dependence of mechanical solder material properties using nanoindentation

W. Muller, H. Worrack
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引用次数: 1

Abstract

Microelectronic components are subjected to a continuous miniaturization process. These efforts of a modern electronic industry require quantitative knowledge of the solder material properties in order to guarantee the reliability of the joining process. Of particular interest are the values of Young's modulus and hardness. Corresponding to the small-size of microelectronic devices is required to use adequately sized specimens and miniature tests. In these studies nanoindentation is applied to determine the material properties of Sn91Zn9 and Sn42Bi58 solder alloys, and also of copper (for a first orientation) and fused silica, which is used for the indenter calibration. Moreover, the potential change of material properties at elevated temperatures is investigated for the materials mentioned. A hot stage add-on allows nanoindentation measurements up to +500°C in order to characterize the various materials in great detail. The melting points of the solder alloys are 199°C and 138°C for Sn91Zn9 and Sn42Bi58, respectively. The prohibition of the lead containing eutectic SnPb solder alloy requires research work in lead-free materials. This paper describes the setup and the analysis of temperature-dependent material tests and presents first results for Young's modulus, hardness, and yield stress, which are compared to literature, at least as far as possible. Furthermore this paper has the goal to verify the measurement setup and the subsequent data evaluation.
基于纳米压痕的机械焊料性能温度依赖性实验研究
微电子元件经历了一个不断小型化的过程。现代电子工业的这些努力需要对焊料性能的定量了解,以保证连接过程的可靠性。特别有趣的是杨氏模量和硬度的值。与微电子器件的小尺寸相对应的是需要使用适当尺寸的试样和微型化试验。在这些研究中,纳米压痕被用于确定Sn91Zn9和Sn42Bi58钎料合金的材料性能,以及铜(用于第一取向)和熔融二氧化硅的材料性能,用于压头校准。此外,还研究了上述材料在高温下材料性能的潜在变化。热阶段附加组件允许纳米压痕测量高达+500°C,以便非常详细地表征各种材料。Sn91Zn9和Sn42Bi58钎料合金的熔点分别为199℃和138℃。禁止含铅共晶SnPb钎料合金需要在无铅材料方面进行研究。本文描述了温度相关材料测试的设置和分析,并给出了杨氏模量、硬度和屈服应力的初步结果,这些结果至少尽可能地与文献进行了比较。此外,本文的目的是验证测量设置和随后的数据评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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