Batch Clone Detection in RFID-enabled supply chain

Jie Shi, Su Mon Kywe, Yingjiu Li
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引用次数: 12

Abstract

Radio Frequency IDentification (RFID) technology plays an important role in deterring counterfeit products. There are, however, many unsolved challenges in designing an effective and efficient RFID system for anti-counterfeiting purpose. The first challenge lies in designing a system which is suitable for standard passive RFID tags, especially EPC C1G2 tags, which are widely used in real-world supply chains. These tags cannot afford strong security primitives due to very limited storage and computational capability. The second challenge lies in designing a system which can efficiently handle a increasing number of RFID products. Existing approaches for clone tag detection suffer from performance bottlenecks because a centralized detection server is required in these approaches to record and analyze the traces of all individual products. Thirdly, a practical approach to clone tag detection should work efficiently in real-world RFID systems, where products are moved and processed in batches. To address these challenges, we propose a Batch Clone Detection (BCD) scheme, which is simple, efficient, and practical. It requires only a few bits of storage in RFID tags and no computation on RFID tags, which makes it suitable for standard EPC C1G2 tags. In BCD scheme, the clone tag detection is performed at a batch level, which significantly reduces the storage and computational overheads on the server side.
rfid供应链中的批量克隆检测
射频识别(RFID)技术在防伪方面发挥着重要作用。然而,在设计一个有效的RFID防伪系统方面,仍有许多未解决的挑战。第一个挑战是设计一个适用于标准无源RFID标签的系统,特别是EPC C1G2标签,这在现实世界的供应链中广泛使用。由于存储和计算能力非常有限,这些标签无法提供强大的安全原语。第二个挑战在于设计一个能够有效处理越来越多的RFID产品的系统。克隆标记检测的现有方法存在性能瓶颈,因为在这些方法中需要一个集中的检测服务器来记录和分析所有单个产品的踪迹。第三,克隆标签检测的实际方法应该在实际的RFID系统中有效地工作,其中产品是批量移动和加工的。为了解决这些问题,我们提出了一种简单、高效、实用的批量克隆检测(BCD)方案。它只需要在RFID标签中存储少量比特,并且不需要在RFID标签上进行计算,这使得它适合于标准的EPC C1G2标签。在BCD方案中,克隆标记检测是在批处理级别执行的,这大大减少了服务器端的存储和计算开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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