Optimized design of successive approximation time-to-digital converter with single set of delay lines

D. Koscielnik, Jakub Szyduczynski, D. Rzepka, W. Andrysiewicz, M. Miśkowicz
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引用次数: 5

Abstract

The paper addresses the problems of design of picosecond resolution time-to-digital converter based on successive approximation (SA-TDC). The principle of the conversion process in SA-TDC consists in successive delaying the events defining a start and a stop of the input time interval by the use of binary-weighted delays. The paper is focused on optimization of particular components of the SA-TDC architecture with a single set of delay lines in order to reduce differential (DNL) and integral (INL) nonlinearities. In particular, the paper contribution is an improvement of time resolution of the converter from 25 ps to 12.5 ps (i.e., by one extra bit) in 180 nm CMOS technology through enhancements of design of circuit components which results in a reduction of conversion errors.
单组延迟线逐次逼近时数转换器的优化设计
本文讨论了基于逐次逼近的皮秒分辨率时间-数字转换器的设计问题。SA-TDC转换过程的原理是通过使用二元加权延迟连续延迟定义输入时间间隔的开始和停止的事件。本文的重点是优化具有单组延迟线的SA-TDC架构的特定组件,以减少微分(DNL)和积分(INL)非线性。特别是,论文的贡献是通过改进电路元件的设计,从而减少转换误差,将180 nm CMOS技术中的转换器的时间分辨率从25 ps提高到12.5 ps(即多一个比特)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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