Reducing Threading Dislocation Densities in SiGe Mismatched Layers by Controllingc Strainc rate and Surface Roughness

S. Gupta, Yu Bai, D. Isaacson, E. Fitzgerald
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引用次数: 1

Abstract

Further insight into strained layer relaxation processes have been achieved in this work. Effects of surface roughness, dislocation velocities, and dislocation nucleation have been de-coupled. In order to achieve low threading dislocation density with a high degree of relaxation, we are forced to create structures that introduce a high degree of lattice mismatch at the surface, i.e. a gradient in Ge composition in thickness. Thus, the graded layer must be introduced. However, these experiments have shed further light on the design of such structures, and we have produced relaxed layers with low threading dislocation density that are 4times less thick than their control graded composition layers
通过控制应变速率和表面粗糙度降低SiGe错配层中的螺纹位错密度
在这项工作中,进一步深入了解了应变层的松弛过程。表面粗糙度、位错速度和位错成核的影响已经解耦。为了实现高松弛度的低螺纹位错密度,我们被迫创建在表面引入高度晶格不匹配的结构,即Ge成分在厚度上的梯度。因此,必须引入梯度层。然而,这些实验进一步阐明了这种结构的设计,并且我们已经生产出具有低螺纹位错密度的松弛层,其厚度比其控制的渐变组成层少4倍
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