Non-volatile Spin-Transfer Torque RAM (STT-RAM): An analysis of chip data, thermal stability and scalability

A. Driskill-Smith, S. Watts, D. Apalkov, D. Druist, X. Tang, Z. Diao, X. Luo, A. Ong, V. Nikitin, E. Chen
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引用次数: 22

Abstract

STT-RAM (Spin-Transfer Torque Random Access Memory) is a fast (≪10 ns), scalable, durable, non-volatile memory technology that is easily embedded in standard CMOS processes. An STT-RAM memory cell consists of an access transistor and a magnetic tunnel junction (MTJ) storage element (Figure 1). The minimum area of a single-level STT-RAM cell is 6 F2, which is competitive with DRAM and NOR Flash, and superior to SRAM. Even smaller effective unit cell areas are projected for multi-level cell architectures.
非易失性自旋转移扭矩RAM (STT-RAM):芯片数据,热稳定性和可扩展性的分析
STT-RAM(自旋传递扭矩随机存取存储器)是一种快速(≪10 ns)、可扩展、耐用、非易失性存储器技术,可轻松嵌入标准CMOS工艺中。STT-RAM存储单元由一个存取晶体管和一个磁隧道结(MTJ)存储元件组成(图1)。单级STT-RAM存储单元的最小面积为6 F2,与DRAM和NOR闪存竞争,优于SRAM。甚至更小的有效单元面积被投射到多层次的单元结构中。
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