IEC 61000-4-2 ESD test in display down configurationfor cell phones

Jianchi Zhou, Satyajeet Shinde, Yuandong Guo, A. Talebzadeh, Shubhankar Marathe, Y. Gan, Ki-Hyuk Kim, D. Pommerenke
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引用次数: 9

Abstract

During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and the flatness of the insulator which may deteriorate over time. The discharges to the phone lead to a large displacement current flowing through the display. This current has multiple paths to the body of the phone: via the touch electronics, via the display electronics, and directly to the body of the phone. As these currents can reach 30 A (at 8 kV contact mode) they can lead to upset and damage of both the display and the touch layers. This paper provides analysis of the display down test situation in order to show reproducibility problems. The effect of the capacitance variation is shown by the measurement and the PSPICE model. Full-wave model was used to help understand how much of the total current flows through the body of the phone. The Lichtenberg dust figure method was used to show the contribution of the corona discharge.
IEC 61000-4-2手机显示down配置中的ESD测试
在IEC 61000-4-2测试过程中,被测物放置在0.5 mm绝缘片上,该绝缘片位于水平耦合平面(HCP)上。对于手机背面的放电点,这会导致显示器面对HCP的情况。手机或平板电脑对HCP形成50pf到300pf之间的电容。电容值取决于手机的大小、屏幕的平整度和绝缘体的平整度,而绝缘体的平整度可能会随着时间的推移而恶化。对手机的放电导致大位移电流流过显示屏。这种电流有多条路径到达手机机身:通过触摸电子设备,通过显示电子设备,直接到达手机机身。由于这些电流可以达到30 A(在8 kV接触模式下),它们可能导致显示器和触摸层的扰乱和损坏。本文对显示down测试情况进行了分析,以说明再现性问题。测量结果和PSPICE模型显示了电容变化的影响。全波模型被用来帮助理解流过手机机身的总电流有多少。采用利希滕贝格粉尘图法来显示电晕放电的贡献。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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