Towards an analytical description of a TaO memristor

A. Ascoli, R. Tetzlaff, V. Ntinas, G. Sirakoulis
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Abstract

Memristors promise to revolutionise the world of electronics in the years to come. Besides their most popular applications in the fields of non-volatile memory design and neuro-morphic system development, their ability to process signals and store data in the same physical location may allow the conception of novel mem-computing machines outperforming state-of-the-art hardware systems suffering from the Von Neumann bottleneck. The complexity of real-world memristor models, capturing the inherent nonlinearity of the switching kinetics of the nanodevices, is one of the obstacles towards an extensive exploration of the full potential of memristors in nanoelectronics. It is well-known, in fact, that serious convergence issues frequently arise in the numerical simulation of the differential algebraic equation sets modelling the dynamics of real-world memristors. In this work we propose a strategy to develop a general closed-form mathematical representation of a real-world voltage-controlled memristor manufactured by Hewlett Packard Enterprise. The study aims to derive an analytical formula for the memductance of the nano-device under a general voltage input, starting off from the DC case. This research should be of great benefit to circuit designers, which typically use analytical formulas for the first hands-on calculations in the search for circuit topologies satisfying a certain set of specifications.
对TaO忆阻器的分析描述
忆阻器有望在未来几年彻底改变电子世界。除了它们在非易失性存储器设计和神经形态系统开发领域最受欢迎的应用之外,它们在同一物理位置处理信号和存储数据的能力可能使新型mems计算机器的概念超越了遭受冯·诺伊曼瓶颈的最先进硬件系统。现实世界中忆阻器模型的复杂性,捕获了纳米器件开关动力学的固有非线性,是纳米电子学中广泛探索忆阻器全部潜力的障碍之一。事实上,众所周知,在模拟真实忆阻器动力学的微分代数方程组的数值模拟中,经常出现严重的收敛问题。在这项工作中,我们提出了一种策略,以开发由惠普企业制造的实际压控记忆电阻器的一般封闭形式数学表示。该研究旨在从直流情况出发,推导出在一般电压输入下纳米器件的电导率的解析公式。这项研究应该对电路设计者有很大的好处,他们通常使用解析公式进行第一次动手计算,以寻找满足特定规格的电路拓扑。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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