Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures

D. Appello, P. Bernardi, A. Calabrese, S. Littardi, G. Pollaccia, S. Quer, V. Tancorre, R. Ugioli
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引用次数: 4

Abstract

With the explosion of off-the-shelf SoCs in terms of size and the advent of novel techniques related to failure modes, commercial ATPG and fault simulation engines can often be insufficient to measure the coverage of very specific metrics. In these cases, many researchers firstly store the simulation trace during the analysis phase. Then, they collect the desired statistics during a post-processing step. In this framework, the so-called Value Change Dump (VCD) is a very commonly used file format to record simulation traces. The target of this paper is twofold. From the one hand, we illustrate some Burn-In (BI) related metrics which cannot be evaluated by current commercial fault simulators and ATPG engines. These metrics are indeed based on a post-processing analysis of memory dumps in VCD format. From the other hand, we mitigate the evaluation time and the memory required to analyze huge VCD files by exploiting optimization techniques coming from modern programming features and smart parallelization. Adopting this strategy, we can analyze simulation dumps of more than 250 GBytes in less than one hour, showing improvements of two orders of magnitude over previous tools, with a consequent higher scalability and testability power.
基于多核架构并行化的仿真转储加速分析
随着现成soc在尺寸方面的爆炸式增长,以及与故障模式相关的新技术的出现,商用ATPG和故障模拟引擎通常不足以测量非常具体指标的覆盖范围。在这些情况下,许多研究人员首先在分析阶段存储模拟跟踪。然后,在后处理步骤中收集所需的统计信息。在这个框架中,所谓的Value Change Dump (VCD)是一种非常常用的记录模拟轨迹的文件格式。本文的目标是双重的。一方面,我们举例说明了目前商用故障模拟器和ATPG引擎无法评估的一些与Burn-In (BI)相关的指标。这些指标实际上是基于对VCD格式的内存转储的后处理分析。另一方面,我们通过利用来自现代编程特性和智能并行化的优化技术,减少了分析大型VCD文件所需的评估时间和内存。采用此策略,我们可以在不到一小时的时间内分析超过250 gb的模拟转储,与以前的工具相比,显示出两个数量级的改进,从而具有更高的可伸缩性和可测试性能力。
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