H. A. Abdel-Aziz, M. M. Abdel-Aziz, A. Wassal, A. Abou-Auf
{"title":"Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures","authors":"H. A. Abdel-Aziz, M. M. Abdel-Aziz, A. Wassal, A. Abou-Auf","doi":"10.1109/IDT.2010.5724421","DOIUrl":null,"url":null,"abstract":"In this paper, we develop a methodology for generating the worst-case test vectors (WCTV) necessary to detect leakage current failures in a standard-cell based ASIC device exposed to a total ionizing dose. The methodology is based on using the genetic algorithm technique and as such it produces a near worst-case vector. The methodology is validated experimentally by applying the generated vectors on a test chip after exposure to total dose. In terms of total-dose induced leakage current failures, experiments shown that the near worstcase vector results are very close to those of the worst-case vector.","PeriodicalId":153183,"journal":{"name":"2010 5th International Design and Test Workshop","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 5th International Design and Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDT.2010.5724421","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we develop a methodology for generating the worst-case test vectors (WCTV) necessary to detect leakage current failures in a standard-cell based ASIC device exposed to a total ionizing dose. The methodology is based on using the genetic algorithm technique and as such it produces a near worst-case vector. The methodology is validated experimentally by applying the generated vectors on a test chip after exposure to total dose. In terms of total-dose induced leakage current failures, experiments shown that the near worstcase vector results are very close to those of the worst-case vector.