S. Khandelwal, Brian Novak, Jordan Merkel, Ken A. Nagamatsu, J. Parke, Mark Yu, P. Shea, R. Howell
{"title":"SLC-ASM-HEMT: An Accurate compact model for SLCFET RF switch","authors":"S. Khandelwal, Brian Novak, Jordan Merkel, Ken A. Nagamatsu, J. Parke, Mark Yu, P. Shea, R. Howell","doi":"10.1109/BCICTS48439.2020.9392941","DOIUrl":null,"url":null,"abstract":"Accurate compact model for simulating radiofrequency (RF) switch characteristics of a Super Lattice Castellated Field Effect Transistor (SLCFET) is presented. The new model is developed by modifying the industry standard ASM-HEMT compact model formulations. It is found that multiple channels of SLCFET cause unique I-V and S-parameters behavior of this technology. An accurate, and computationally efficient compact model is obtained after modifying ASM-HEMT formulations for multi-channel device electrostatics in SLCFET. The model is shown to be in good agreement with measurements for DC and RF device characteristics.","PeriodicalId":355401,"journal":{"name":"2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCICTS48439.2020.9392941","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Accurate compact model for simulating radiofrequency (RF) switch characteristics of a Super Lattice Castellated Field Effect Transistor (SLCFET) is presented. The new model is developed by modifying the industry standard ASM-HEMT compact model formulations. It is found that multiple channels of SLCFET cause unique I-V and S-parameters behavior of this technology. An accurate, and computationally efficient compact model is obtained after modifying ASM-HEMT formulations for multi-channel device electrostatics in SLCFET. The model is shown to be in good agreement with measurements for DC and RF device characteristics.