Fault detection in multiple valued logic circuits

Abstract

There are k=p/sup n/ different canonical representations for a given multiple-valued-logic (MVL) function, where k is called the polarity, and p and n denote the radix and the number of variables of a function, respectively. The coefficients in a canonical representation are called spectral coefficients. Relationships between the functional values of a function and the spectral coefficients are given. A relation between the number of spectral coefficients that a fault may distort and the number of test patterns required to detect the fault is given. It is also shown that the test patterns can be generated systematically.<>