A study of impulsive noise immunity for wavelet-OFDM-based power line communications

Abstract

In the specification of IEEE P1901-2010, which is the standard for high speed communication devices via electric power lines, two physical layer technologies are defined. One is called fast Fourier transform (FFT)-based orthogonal frequency-division multiplexing (OFDM) and the other is wavelet-based OFDM (Wavelet-OFDM). However, few studies have been discussed the impact of impulsive noise (IN) for Wavelet-OFDM-based PLC systems. This paper preliminarily study the impact of IN on both FFT-OFDM and Wavelet-OFDM-based PLC systems in additive white Gaussian noise (AWGN) channel model. Due to the overlapping in time domain, the Wavelet-OFDM become more prone to IN than the FFT-OFDM.