Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead

M. Casale-Rossi, A. Sangiovanni-Vincentelli, L. Carloni, B. Courtois, H. Man, A. Domic, J. Rabaey
{"title":"Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead","authors":"M. Casale-Rossi, A. Sangiovanni-Vincentelli, L. Carloni, B. Courtois, H. Man, A. Domic, J. Rabaey","doi":"10.7873/DATE.2013.049","DOIUrl":null,"url":null,"abstract":"Thirty-two years ago, Electronics Magazine honored Carver Mead and Lynn Conway with its Achievement Award for their contributions to VLSI chip design. The 'Mead & Conway methods' were being taught at 100+ universities all over the world, and \"not only have helped spawn a common design culture so necessary in the VLSI era, but have greatly increased interaction between university and industry so as to stimulate research by both.\" Concepts such as simplified design methods, new, electronic representations of digital design data, scalable design rules, 'clean' formalized digital interfaces between design and manufacturing, and widely accessible silicon foundries suddenly enabled many thousands of chip designers to create many tens of thousands of chip designs. Today, as Moore's Law -- a term coined by Carver Mead -- has brought as from 10 microns to 10 nanometers, what is the heritage of Mead & Conway?\n UCB Professor Alberto Sangiovanni-Vincentelli will moderate an industry and research panel, to discuss what has remained the same, what was missed, what has changed, and what lies ahead.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7873/DATE.2013.049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Thirty-two years ago, Electronics Magazine honored Carver Mead and Lynn Conway with its Achievement Award for their contributions to VLSI chip design. The 'Mead & Conway methods' were being taught at 100+ universities all over the world, and "not only have helped spawn a common design culture so necessary in the VLSI era, but have greatly increased interaction between university and industry so as to stimulate research by both." Concepts such as simplified design methods, new, electronic representations of digital design data, scalable design rules, 'clean' formalized digital interfaces between design and manufacturing, and widely accessible silicon foundries suddenly enabled many thousands of chip designers to create many tens of thousands of chip designs. Today, as Moore's Law -- a term coined by Carver Mead -- has brought as from 10 microns to 10 nanometers, what is the heritage of Mead & Conway? UCB Professor Alberto Sangiovanni-Vincentelli will moderate an industry and research panel, to discuss what has remained the same, what was missed, what has changed, and what lies ahead.
专题讨论:Mead & Conway的遗产:什么是不变的,什么是错过的,什么是改变的,什么是未来
32年前,电子杂志授予Carver Mead和Lynn Conway成就奖,以表彰他们对VLSI芯片设计的贡献。“Mead & Conway方法”在全球100多所大学教授,“不仅帮助催生了VLSI时代必不可少的共同设计文化,而且大大增加了大学和工业之间的互动,从而刺激了两者的研究。”诸如简化的设计方法、数字设计数据的新型电子表示、可扩展的设计规则、设计和制造之间“干净”的形式化数字接口以及广泛可访问的硅铸造厂等概念突然使成千上万的芯片设计师能够创造出成千上万的芯片设计。今天,随着摩尔定律——卡弗·米德创造的一个术语——把10微米带到了10纳米,米德和康威的传统是什么?UCB教授Alberto Sangiovanni-Vincentelli将主持一个行业和研究小组,讨论什么是不变的,什么是错过的,什么是改变的,什么是未来。
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