C. Viegas, B. Alderman, F. A. Muhammad, P. Huggard, C. Duff, R. Sloan, J. Powell
{"title":"Broadband THz imaging of composite materials","authors":"C. Viegas, B. Alderman, F. A. Muhammad, P. Huggard, C. Duff, R. Sloan, J. Powell","doi":"10.1109/IMWS-AMP.2016.7588333","DOIUrl":null,"url":null,"abstract":"Imaging composite materials is a challenging task due to the continual improvement in material quality and inspection demands. This paper describes a novel broadband THz noise mapping technique that performs active imaging of composite materials. The transmission measurement consists of an amplified photonic noise source to illuminate the sample and a W-band Schottky diode based radiometer to obtain the intensity profile as a function of scan position. The experimental set-up and preliminary results are presented.","PeriodicalId":132755,"journal":{"name":"2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMWS-AMP.2016.7588333","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Imaging composite materials is a challenging task due to the continual improvement in material quality and inspection demands. This paper describes a novel broadband THz noise mapping technique that performs active imaging of composite materials. The transmission measurement consists of an amplified photonic noise source to illuminate the sample and a W-band Schottky diode based radiometer to obtain the intensity profile as a function of scan position. The experimental set-up and preliminary results are presented.