{"title":"Failure and Thermal Dissipation Analysis with Infrared Thermography","authors":"Stephan R. Larmann","doi":"10.31399/asm.cp.istfa2022tph1","DOIUrl":null,"url":null,"abstract":"\n This presentation is a pictorial overview on the implementation of lock in thermography, the various types of images that can be obtained, and the interpretation of the results. It also includes a refresher on the use of discrete Fourier transforms (DFT) in signal processing.","PeriodicalId":417175,"journal":{"name":"International Symposium for Testing and Failure Analysis","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium for Testing and Failure Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2022tph1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This presentation is a pictorial overview on the implementation of lock in thermography, the various types of images that can be obtained, and the interpretation of the results. It also includes a refresher on the use of discrete Fourier transforms (DFT) in signal processing.