TID and SEE Evaluation on a Universal input, 10-output low impedance LVCMOS buffer

Abstract

This paper presents the latest test results of the Texas Instruments CDCLVC1310, a universal input, 10-output low impedance LVCMOS buffer. The device has been tested for total ionizing dose effects up to $\sim 250$ krad(SiO2), including high and low dose rate conditions. Furthermore, the response to single event effects using protons and heavy-ions has been investigated. Here, no destructive events and a fairly low event rate for soft errors were observed.