A Single-Temperature-Calibration 0.18-µm CMOS Time-Based Resistive Sensor Interface with Low Drift over a −40°C to 175°C Temperature Range

Jorge Marin, E. Sacco, Johan Vergauwen, G. Gielen
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引用次数: 6

Abstract

This paper presents a very-low-drift 0.181µ m CMOS time-based resistive-bridge sensor interface. It exhibits only 3.8 ppm/° C gain drift and 0.3 ppm/°C offset drift for the entire −40°C to 175°C temperature range using a single-temperature calibration scheme and no external accurate references nor components. The interface provides a 15 ENOB for a 100ms conversion time, consuming 3.41mW of power and 0.26mm2 of active area. The holistic drift-resilience strategy combines time-based chopping and VCO tuning to remove the DC and low-frequency errors introduced by VCO nonidealities and drift.
单温度校准0.18µm CMOS时基电阻传感器接口,低漂移,温度范围为- 40°C至175°C
本文提出了一种极低漂移0.181µm CMOS时基电阻式电桥传感器接口。它显示只有3.8 ppm/°C增益漂移和0.3 ppm/°C偏移整个−40°C至175°C的温度范围使用单一温度校准方案,没有外部精确参考或组件。该接口提供15 ENOB,转换时间为100ms,功耗为3.41mW,有效面积为0.26mm2。整体漂移恢复策略结合了基于时间的斩波和VCO调谐,以消除由VCO非理想性和漂移引起的直流和低频误差。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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