{"title":"Transient analysis of BJT using all injection level TLEC model","authors":"T.V. Pesic, T. Ilic, N. Jankovic, J. Karamarković","doi":"10.1109/ICMEL.2000.840543","DOIUrl":null,"url":null,"abstract":"Transmission line equivalent circuit model of bipolar junction transistor has been generalized to include all injection level case and model Kirk effect. The obtained model has been used for simulation of time domain transient analysis.","PeriodicalId":215956,"journal":{"name":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","volume":"178 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2000.840543","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Transmission line equivalent circuit model of bipolar junction transistor has been generalized to include all injection level case and model Kirk effect. The obtained model has been used for simulation of time domain transient analysis.