Image processing technology for scanning electron microscopy

Abstract

Quantification of the noise content in the scanning electron microscope image is an important parameter in the signal-to-noise ratio. The most common type of noise in SEM image is the Gaussian noise. We compared different noise reduction filters, like average, median, Gaussian Smoothing and Wiener filters, in order to see the image improvement. Based on the experiment results the most promising is the Wienerfilter.