Soft fails due to LU stress of virtual power domains

2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2015-11-02 DOI:10.1109/EOSESD.2015.7314795

K. Domanski, H. Gossner

引用次数: 5

Abstract

A shut-down of IC was caused by current injection into a USB 2.0 pin. Root cause was a substrate current forced into a power rail supplied by a weak LDO. Connecting the guard rings to a robust VDD supply resolved the problem. As the failure could not be revealed by JESD78 testing, a modified latchup test setup is proposed.

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虚拟电源域的LU应力导致软故障

由于电流注入USB 2.0引脚，导致IC关闭。根本原因是基板电流被迫进入由弱LDO供电的电源轨道。将保护环连接到一个强大的VDD电源解决了这个问题。由于JESD78测试无法揭示故障，提出了一种改进的闭锁测试装置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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