A switched-voltage high-accuracy sample/hold circuit

K. Ohno, H. Matsumoto, K. Murao
{"title":"A switched-voltage high-accuracy sample/hold circuit","authors":"K. Ohno, H. Matsumoto, K. Murao","doi":"10.1109/APCCAS.2006.342342","DOIUrl":null,"url":null,"abstract":"In this paper, three switched-voltage (SV) sample/hold (S/H) circuits are presented to compensate for clock-feed-through (CFT) and channel-length modulation effect. They consist of a CMOS SV-delay cell. Thus, the configuration is very simple. The proposed circuits can be operated using simple nonoverlapping two phase clocks. The performance is verified by simulations on PSpice.","PeriodicalId":185817,"journal":{"name":"The 2004 47th Midwest Symposium on Circuits and Systems, 2004. MWSCAS '04.","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 2004 47th Midwest Symposium on Circuits and Systems, 2004. MWSCAS '04.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APCCAS.2006.342342","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In this paper, three switched-voltage (SV) sample/hold (S/H) circuits are presented to compensate for clock-feed-through (CFT) and channel-length modulation effect. They consist of a CMOS SV-delay cell. Thus, the configuration is very simple. The proposed circuits can be operated using simple nonoverlapping two phase clocks. The performance is verified by simulations on PSpice.
一个开关电压高精度采样/保持电路
本文提出了三种开关电压(SV)采样/保持(S/H)电路来补偿时钟馈通(CFT)和信道长度调制效应。它们由CMOS sv延迟单元组成。因此,配置非常简单。所提出的电路可以使用简单的非重叠两相时钟进行操作。通过PSpice仿真验证了该算法的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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