Multi-Process, Products and Machine Control Chart Application in Semiconductors

C. J. Wu, J. Wei
{"title":"Multi-Process, Products and Machine Control Chart Application in Semiconductors","authors":"C. J. Wu, J. Wei","doi":"10.1109/ISSM.2018.8651131","DOIUrl":null,"url":null,"abstract":"For foundry factories, the different products have their respective spec in foundry factories, so we standardize it and monitor the process performance by multi-process, multi-products and multi-machine. The standardized control chart can solve the control problems of Shewhart control chart in high-mix and low-volume products, and combine with different products, machines, and process layers. It can also be used in LtL/WtW/WiW to get the variations of these sources immediately.","PeriodicalId":262428,"journal":{"name":"2018 International Symposium on Semiconductor Manufacturing (ISSM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Symposium on Semiconductor Manufacturing (ISSM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSM.2018.8651131","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

For foundry factories, the different products have their respective spec in foundry factories, so we standardize it and monitor the process performance by multi-process, multi-products and multi-machine. The standardized control chart can solve the control problems of Shewhart control chart in high-mix and low-volume products, and combine with different products, machines, and process layers. It can also be used in LtL/WtW/WiW to get the variations of these sources immediately.
多工序、产品和机器控制图在半导体中的应用
对于铸造工厂来说,不同的产品在铸造工厂都有各自的规格,因此我们对其进行标准化,并通过多工序、多产品、多机器来监控工艺性能。标准化控制图可以解决休哈特控制图在高混合、小批量产品中的控制问题,并与不同的产品、机器、工艺层相结合。它也可以在LtL/WtW/WiW中使用,以立即获得这些源的变体。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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