Ziqian Zhang, R. Schürhuber, L. Fickert, Xu Liu, Qian Chen, Yongming Zhang
{"title":"Hardware-in-the-loop Based Grid Compatibility Test for Power Electronics Interface","authors":"Ziqian Zhang, R. Schürhuber, L. Fickert, Xu Liu, Qian Chen, Yongming Zhang","doi":"10.1109/EPE.2019.8778156","DOIUrl":null,"url":null,"abstract":"The future power systems has a clear trend towards power electronic connected generation. In contrast to conventional power systems, dynamic characteristics of power electronic interface strongly depends on the implemented control. This leads to imperative changes in the test and validation method of power electronic interface. This paper presents a new test and validation method based on hardware-in-loop tests in order to adapt to the future power system. Through this new method, equipment manufacturers can speed up the development-testing-certification period of their product and obtain product certification. The grid operator can obtain a credible power electronic interface - grid system stability validation report with the model verified by the hardware-in-loop test.","PeriodicalId":117212,"journal":{"name":"2019 20th International Scientific Conference on Electric Power Engineering (EPE)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Scientific Conference on Electric Power Engineering (EPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPE.2019.8778156","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The future power systems has a clear trend towards power electronic connected generation. In contrast to conventional power systems, dynamic characteristics of power electronic interface strongly depends on the implemented control. This leads to imperative changes in the test and validation method of power electronic interface. This paper presents a new test and validation method based on hardware-in-loop tests in order to adapt to the future power system. Through this new method, equipment manufacturers can speed up the development-testing-certification period of their product and obtain product certification. The grid operator can obtain a credible power electronic interface - grid system stability validation report with the model verified by the hardware-in-loop test.