Hardware-in-the-loop Based Grid Compatibility Test for Power Electronics Interface

Ziqian Zhang, R. Schürhuber, L. Fickert, Xu Liu, Qian Chen, Yongming Zhang
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引用次数: 2

Abstract

The future power systems has a clear trend towards power electronic connected generation. In contrast to conventional power systems, dynamic characteristics of power electronic interface strongly depends on the implemented control. This leads to imperative changes in the test and validation method of power electronic interface. This paper presents a new test and validation method based on hardware-in-loop tests in order to adapt to the future power system. Through this new method, equipment manufacturers can speed up the development-testing-certification period of their product and obtain product certification. The grid operator can obtain a credible power electronic interface - grid system stability validation report with the model verified by the hardware-in-loop test.
基于硬件在环的电力电子接口电网兼容性测试
未来电力系统向电力电子联网发电发展的趋势十分明显。与传统电力系统不同,电力电子接口的动态特性在很大程度上取决于所实施的控制。这导致电力电子接口的测试和验证方法发生了迫切的变化。为了适应未来电力系统的需要,本文提出了一种基于硬件在环测试的新型测试验证方法。通过这种新方法,设备制造商可以加快产品的开发-测试-认证周期,并获得产品认证。该模型经硬件在环试验验证,可为电网运营者提供可靠的电力电子接口-电网系统稳定性验证报告。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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