Proven single pass design methodology for high reliable VDSM

Keun-Ok Seo, Sancho Park
{"title":"Proven single pass design methodology for high reliable VDSM","authors":"Keun-Ok Seo, Sancho Park","doi":"10.1109/APASIC.2000.896959","DOIUrl":null,"url":null,"abstract":"This paper addresses the Avant! silicon proven single pass design methodology for the recent very deep submicron (VDSM) era. Avant!'s single pass process is a predictable and controllable design process with closure in mind, not only for timing but also for signal/power integrity. By applying the right technology to the root cause of a design problem, this process can generate an optimal result in the shortest time.","PeriodicalId":313978,"journal":{"name":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APASIC.2000.896959","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper addresses the Avant! silicon proven single pass design methodology for the recent very deep submicron (VDSM) era. Avant!'s single pass process is a predictable and controllable design process with closure in mind, not only for timing but also for signal/power integrity. By applying the right technology to the root cause of a design problem, this process can generate an optimal result in the shortest time.
经过验证的高可靠性VDSM单通道设计方法
本文讨论了Avant!在最近的极深亚微米(VDSM)时代,硅证明了单通道设计方法。先锋派的!单通过程是一个可预测和可控的设计过程,不仅考虑时序,而且考虑信号/功率完整性。通过将正确的技术应用于设计问题的根本原因,这个过程可以在最短的时间内产生最佳结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信