Product defect prediction model

Abstract

The prediction of software reliability can determine the current reliability of a product, using statistical techniques based on the failures data, obtained during testing or system usability. Software reliability growth models attempt to predict the number of defect using a correlation between exponential function and defect data. The purpose of this paper is to study the evolution of a real-life product over three releases, using the Rayleigh function in order to predict the number of defects. Our paper offers two possibilities for computing the model parameters, and then we should be able to decide which is better and what can be improved. Results from this study will be used to determine which approach is best to be used.