Development of high speed laser soldering process for lead-free solder with diode-laser

Jing-bo Wang, M. Watanabe, Y. Goto, K. Fujii, Hiroyuki Kuriaki, M. Satoh, J. Ikeda, K. Fujimoto
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引用次数: 1

Abstract

The compactness of electronic equipments is leading the narrow pitch assembly of components on board or film by soldering. Diode-laser soldering system had already been realized as a high-density assembly process; however, the soldering quality became unstable when the system targeted to achieve short time, such as sub second, soldering, i.e. high productivity. A high speed soldering process for lead-free solder with diode-laser was developed. By measuring soldering temperature profiles of chips on film, it was found that the time period for soldering temperature reaching melting point at both sides of chip, which was over 0.6 sec, determined the soldering quality. According to SEM observation and EDS analysis, diffusion and inter-metallic layers, which were determined by plated materials of land, formed near the boundary of solder and land.
二极管激光无铅焊料高速激光焊接工艺的开发
电子设备的紧凑性导致了通过焊接在板上或薄膜上组装元件的窄间距。二极管-激光焊接系统已经实现了高密度组装工艺;然而,当系统的目标是实现短时间,如亚秒级的焊接,即高生产率时,焊接质量变得不稳定。研制了一种二极管激光高速焊接无铅焊料的工艺。通过测量芯片在薄膜上的焊接温度分布,发现焊接温度在芯片两侧达到熔点的时间大于0.6秒,这决定了焊接质量。SEM观察和EDS分析表明,钎料与钎料边界附近形成了由镀层材料确定的扩散层和金属间层。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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