P. Korolev, S. Polesskiy, R. Mukhametov, A. Sosnin, K. Sedov, I. Ivanov
{"title":"Hardware/Software Implementation of Simulation Modeling in the Tasks of Electronic Equipment Reliability Function Evaluating","authors":"P. Korolev, S. Polesskiy, R. Mukhametov, A. Sosnin, K. Sedov, I. Ivanov","doi":"10.1109/MWENT47943.2020.9067489","DOIUrl":null,"url":null,"abstract":"The paper presents a solution to the question of increasing authenticity and accuracy in predicting dependability, in particular, the reliability of electronic equipment (EE) by simulation modeling. A review and analysis of existing solutions is carried out and their draw backs are identified. The description of the developed FPGA based VI-module is given, which allows to assess the EE reliability characteristics with an accuracy of 18 decimal places. Also, the developed VI-module is highly reliable due to the use of a random number generator with a repetition period depending on the type of FPGA up to 264-1 in the form of hardware/software implementation based on FPGA.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT47943.2020.9067489","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The paper presents a solution to the question of increasing authenticity and accuracy in predicting dependability, in particular, the reliability of electronic equipment (EE) by simulation modeling. A review and analysis of existing solutions is carried out and their draw backs are identified. The description of the developed FPGA based VI-module is given, which allows to assess the EE reliability characteristics with an accuracy of 18 decimal places. Also, the developed VI-module is highly reliable due to the use of a random number generator with a repetition period depending on the type of FPGA up to 264-1 in the form of hardware/software implementation based on FPGA.