{"title":"Comparison of the state-of-the-art high power IGBTs, GCTs and ETOs","authors":"K. Motto, Y. Li, A. Huang","doi":"10.1109/APEC.2000.822829","DOIUrl":null,"url":null,"abstract":"In this paper, a comparison of three semiconductor devices suitable for high power applications is presented. All devices feature high switching speed and snubberless turn-off capability. The devices compared include one high voltage insulated gate bipolar transistor (HVIGBT) and two types of hard-driven GTO thyristor-the gate commutated turn-off (GCT) thyristor and the emitter turn-off (ETO) Thyristor. The conduction and switching characteristics are compared, and an assessment is presented of the impact on high-power converter circuits for these devices. Test results are shown.","PeriodicalId":347959,"journal":{"name":"APEC 2000. Fifteenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.00CH37058)","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"APEC 2000. Fifteenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.00CH37058)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.2000.822829","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 39
Abstract
In this paper, a comparison of three semiconductor devices suitable for high power applications is presented. All devices feature high switching speed and snubberless turn-off capability. The devices compared include one high voltage insulated gate bipolar transistor (HVIGBT) and two types of hard-driven GTO thyristor-the gate commutated turn-off (GCT) thyristor and the emitter turn-off (ETO) Thyristor. The conduction and switching characteristics are compared, and an assessment is presented of the impact on high-power converter circuits for these devices. Test results are shown.