{"title":"Energy-efficient processing through adaptation and resiliency","authors":"J. Tschanz","doi":"10.1109/GREENCOMP.2010.5598270","DOIUrl":null,"url":null,"abstract":"Today's SoC devices are often constrained by both performance and power requirements. New software capabilities and usage models demand more processing power than ever before, however the increased integration requires advanced power management techniques. Process scaling, which makes this all possible, also leads to increased susceptibility to variations - static process variations as well as dynamic environmental variations in voltage, temperature, and transistor aging.","PeriodicalId":262148,"journal":{"name":"International Conference on Green Computing","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Green Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GREENCOMP.2010.5598270","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Today's SoC devices are often constrained by both performance and power requirements. New software capabilities and usage models demand more processing power than ever before, however the increased integration requires advanced power management techniques. Process scaling, which makes this all possible, also leads to increased susceptibility to variations - static process variations as well as dynamic environmental variations in voltage, temperature, and transistor aging.