Phase retrieval methods for the determination of transverse mode structure in vertical-cavity surface-emitting lasers

Abstract

The transverse mode properties of vertical-cavity surface-emitting lasers (VCSELs) are investigated by spectrally resolved beam profiling. Near field and far field intensity distributions were measured for a top emitting index guided VCSEL. The Gerchberg-Saxton algorithm was employed to retrieve the phase across the laser aperture.