A novel circuit design of true random number generator using magnetic tunnel junction

Abstract

Random numbers are widely used in the cryptography and security systems. However, most of the true random number generators (TRNG) which use physical randomness are with high complexity and high power consumption. This paper proposes a new TRNG circuit using magnetic tunnel junction (MTJ). As one of the reliability issues in MTJ based circuit, the stochastic switching behavior provides a perfect physical source of randomness. The functionality of proposed design is validated by transient simulations with 28nm fully depleted silicon-on-insulator (FDSOI) technology and an accurate MTJ compact model. Simulation results show that our design can generate accurate random bitstream stably. The reliability analysis concerning process variation of MTJs and transistors proves the good variability tolerance of our TRNG design. Furthermore, our design can output stable random bitstream around 30 tuning steps.