ACC: automatic cell characterization

Abstract

The advent of aggressive submicron-VLSI technologies requires an accompanying development in characterization-tools. The large number and diversity of library-components and their multidimensional parameters makes it imperative to employ a fast and automatic flow embodying rigorous methodologies to accomplish the task of library-characterization. This paper describes the ACC (Automatic Cell Characterization) system which combines generic operation, fast electrical simulation and numerical analysis to automatically characterize a library in a multidimensional manner.<>