Using the features of the photoelastic effect to measure the parameters of optoelectronic devices

Abstract

The features of the photoelastic effect are discussed and it is shown that they can be used to measure the parameters of a laser and a photodetector, which are the main units of any optoelectronic product. A brief review of the known methods for measuring the parameters of a laser and a photodetector is carried out, and some limitations in their application are noted. The possibility of using the features of the photoelastic effect for measuring the parameters of the inertia of the photodetector is theoretically substantiated. A formula for calculating the response at the output of an acousto-optic processor to a rectangular input action is derived and used to separately estimate the time of crossing the optical beam by an elastic wave packet and the inertia of the photodetector. It has also been proven that by choosing a short input action, the features of the photoelastic effect can be used to determine the configuration of the cross section of the laser beam and the law of the distribution of the power flux density in it. The results of theoretical studies have been tested by numerical calculations and confirmed by experimental measurements.