The GE high density overlay MCM interconnect method solves high power needs of GaAs system design

M. Gdula, A. Yerman, V. Krishnamurthy, R. Fillion
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引用次数: 3

Abstract

As electronic systems signals and clock rates exceed 100 MHz, designers must consider the use of emerging high performance digital GaAs chip technology. Because GaAs parts do not yield at the high rates of more mature silicon technology devices, it is presently infeasible to build monolithic wafer scale integration (WSI) with GaAs technology. A hybrid wafer scale integration (HWSI) approach has been developed to overcome the limits of monolithic approaches, including the ability to provide for multichip module (MCM) process optimizations serving low IR loss requirements for power delivery, and use of overlay interconnect, first placing the chip into a structure for the most advantageous thermal management.<>
GE高密度叠加MCM互连方法解决了GaAs系统设计的高功率需求
由于电子系统信号和时钟速率超过100 MHz,设计人员必须考虑使用新兴的高性能数字GaAs芯片技术。由于GaAs部件的成品率不像更成熟的硅技术器件那样高,因此目前用GaAs技术构建单片晶圆级集成(WSI)是不可行的。一种混合晶圆规模集成(HWSI)方法已经被开发出来,以克服单片方法的局限性,包括提供多芯片模块(MCM)工艺优化的能力,以满足电力传输的低红外损耗要求,以及使用覆盖互连,首先将芯片放入最有利的热管理结构中。
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