Nano-finishing of MEMS-based platforms for optimum optical sensing

Ankur Gupta, Poonam Sundriyal, A. Basu, Kapil Manoharan, R. Kant, S. Bhattacharya
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引用次数: 7

Abstract

Abstract The surface finish of the microelectromechanical systems substrate, particularly the ones that are deployed in chip-based optofluidic systems, is of utmost importance, and the overall surface finish helps in preventing light scattering and associated losses. The proposed system is made up of a microchannel with a coating on its interior which acts as a cladding layer and possesses an air-like refractive index. The water-based solutions with refractive indices higher than the coating, when confined within such channels, act as waveguides with a refractive index difference which would allow grazing incidence at the solution film interface. The microchannel is fabricated over a piece of Si along <100> direction with the help of lithography and wet etching technique. After wet chemical etching of silicon, multiple pyramidal hillocks with overall large surface roughness is observed which are not appropriate for loss-free light transmission and cause various optical losses. So the overall optimization of surface roughness created by the etching processes is critical from an optical standpoint. Roughness in the microchannel surface mainly arises due to wet etching through tetra methyl alcohol, potassium hydroxide, potassium ferricyanide and isopropyl alcohol. In this work, we have obtained surface finish upto ~1.33 nm at an etch rate of 141 nm/min which is obtained by tweaking the composition of the participating reagents in the etchants and also the etching temperature. The surface roughness obtained is quite small in comparison to the wavelength range of the visible spectrum and thus losses were greatly avoided. The low refractive index films over silicon substrate were characterized by field emission scanning electron microscopy, energy dispersive analysis of X-ray, atomic force microscopy, 3D optical profilometry and ellipsometry. The transmission results show that transmission loss was reduced by 27.42% for the coated samples with 33 nm surface roughness as compared to surface with 250 nm roughness.
基于mems的光学传感平台的纳米精加工
摘要:微机电系统衬底的表面光洁度,特别是在基于芯片的光流体系统中部署的衬底,是至关重要的,整体表面光洁度有助于防止光散射和相关损失。该系统由一个微通道组成,其内部有一层涂层,作为包层,具有类似空气的折射率。折射率高于涂层的水基溶液,当被限制在这样的通道中时,作为具有折射率差异的波导,这将允许在溶液膜界面处发生掠入射。利用光刻和湿法蚀刻技术在硅片上沿方向制备微通道。对硅进行湿法化学刻蚀后,观察到多个表面粗糙度总体较大的金字塔丘,这些金字塔丘不适合无损耗光传输,造成各种光学损失。因此,从光学角度来看,蚀刻工艺产生的表面粗糙度的整体优化是至关重要的。微通道表面的粗糙度主要是由四甲醇、氢氧化钾、铁氰化钾和异丙醇湿法蚀刻引起的。在这项工作中,我们通过调整蚀刻剂中参与试剂的组成和蚀刻温度,以141 nm/min的蚀刻速率获得了高达~1.33 nm的表面光洁度。与可见光谱的波长范围相比,获得的表面粗糙度相当小,从而大大避免了损失。采用场发射扫描电镜、x射线能量色散分析、原子力显微镜、三维光学轮廓术和椭偏仪对硅衬底上的低折射率薄膜进行了表征。透射结果表明,表面粗糙度为33 nm的涂层比表面粗糙度为250 nm的涂层的透射损失降低了27.42%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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